Mechanical spectroscopy of materials using atomic force microscopy (AFM-MS).

ABSTRACT: Here, we present a novel mechano-spectroscopic atomic force microscopy (AFM-MS) technique that overcomes the limitations of current spectroscopic methods by combining the high-resolution imaging capabilities of AFM with machine learning (ML) classification. AFM-MS employs AFM operating in sub-resonance tapping imaging mode, which enables the collection of multiple physical and mechanical property maps of a sample with sub-nanometer lateral resolution in a highly repeatable manner. By comparing these properties to a database of known materials, the technique identifies the location of constituent materials at each image pixel with the assistance of ML algorithms. We demonstrate AFM-MS on various material mixtures, achieving an unprecedented lateral spectroscopic resolution of 1.6 nm. This p

SUBMITTER: Petrov M 

PROVIDER: S-EPMC12126208 | biostudies-literature | 2024 Nov

REPOSITORIES: biostudies-literature