A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction.

ABSTRACT: Grazing-incidence X-ray diffraction (GIXD) is widely used for the structural characterization of thin films, particularly for analyzing phase composition and the orientation distribution of crystallites. While various tools exist for qualitative evaluation, a widely applicable systematic procedure to obtain quantitative information has not yet been developed. This work presents a first step in that direction, allowing accurate quantitative information to be obtained through the evaluation of radial line profiles from GIXD data. An algorithm is introduced for computing radial line profiles based on the crystal structure of known compounds. By fitting experimental data with calculated line profiles, accurate quantitative information about orientation distribution and phase composition is obt

SUBMITTER: Gasser F 

PROVIDER: S-EPMC12321010 | biostudies-literature | 2025 Aug

REPOSITORIES: biostudies-literature