On the use of beam precession for serial electron crystallography.

ABSTRACT: During the past few years, serial electron crystallography (serial electron diffraction) has been gaining attention for the structure determination of crystalline compounds that are sensitive to irradiation by an electron beam. By recording a single electron diffraction pattern per crystal, indexing thousands to tens of thousands of such patterns and merging the reflection intensities of the successfully indexed patterns, one can retrieve crystal structure models with strongly mitigated beam damage contributions. However, one of the technique's bottlenecks is the need to obtain so many well indexed diffraction patterns, which leads to the collection of raw diffraction data in an automated way that usually yields low indexing rates. This work demonstrates how to overcome this limitation by

SUBMITTER: Plana-Ruiz S 

PROVIDER: S-EPMC12321033 | biostudies-literature | 2025 Aug

REPOSITORIES: biostudies-literature