3D/4D imaging of complex and deformed microstructures with pink-beam dark field X-ray microscopy.
Ontology highlight
ABSTRACT: Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-hungry nature of monochromatic DFXM limits its applicability for studying highly deformed or weakly crystalline structures, and constrains time-resolved studies in industrially relevant materials. Here, we present pink-beam DFXM (pDFXM) at the ID03 beamline of ESRF, achieving a 27-fold increase in diffracted intensity while maintaining 100 nm spatial resolution. We validate pDFXM by imaging a partially recrystallized aluminum grain, confirming sufficient angular resolution for microstructure mapping. The increased flux significantly enhances the diffracted signal, enabling the r
SUBMITTER: Yildirim C
PROVIDER: S-EPMC12396957 | biostudies-literature | 2025
REPOSITORIES: biostudies-literature
ACCESS DATA