A reference material for X-ray diffraction line profile analysis.

ABSTRACT: A nanocrystalline Fe-1.8%Cr steel powder was tested as a reference material on more than five powder diffraction instruments and configurations, as well as with different data-analysis methodologies. The material, commercially available at low cost, was ground in a high-energy planetary mill to obtain homogeneous crystalline domain dimensions of 10 (2) nm, with size dispersion of 5 (1) nm and a nominal dislocation density of the order of 2.90 (2) × 10¹⁶ m^-2. The powder is stable, easy to handle and suitable for preparing samples in any measurement geometry. It is well suited for testing the modelling of diffraction peak profiles, either individually or across the entire diffraction pattern, as in the Rietveld method. This paper reports the simple details for the produ

SUBMITTER: Scardi P 

PROVIDER: S-EPMC12502865 | biostudies-literature | 2025 Oct

REPOSITORIES: biostudies-literature