Detecting grain-scale plastic deformation events with time-resolved far-field high-energy diffraction microscopy.

ABSTRACT: Far-field high-energy diffraction microscopy (ff-HEDM) bridges a critical gap between microscale and macroscale plasticity by enabling three-dimensional (3D) time-resolved observations of grain-scale deformation. It can be used to measure the grain-averaged elastic strain tensor, crystallographic orientation, centroid and relative volume of each individual grain. Researchers have also proposed methods to extract information about grain-scale plastic deformation from time-resolved ff-HEDM measurements, using e.g. signature changes in a grain's equivalent or resolved shear stress, orientation or diffraction peak width. However, the accuracy of these different methods is largely unexplored due to the absence of an independent ground truth, particularly for plastic deformation that occu

SUBMITTER: Jin Y 

PROVIDER: S-EPMC12502869 | biostudies-literature | 2025 Oct

REPOSITORIES: biostudies-literature