High-Speed Quantitative Nanomechanical Mapping by Photothermal Off-Resonance Atomic Force Microscopy.

ABSTRACT: Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information beyond topography, with nanomechanical properties as a prime example. Here, a method based on photothermal off-resonance tapping (PORT) is presented to increase the speed of such force spectroscopy measurements by at least an order of magnitude, thereby enabling high-throughput, quantitative nanomechanical mapping of a wide range of materials. Specifically, photothermal actuation is used to modulate the position of the AFM probe at frequencies that far exceed those possible with traditional actuation by piezo-driven z scanners. Understanding and accounting

SUBMITTER: Gunstheimer H 

PROVIDER: S-EPMC12508714 | biostudies-literature | 2025 Oct

REPOSITORIES: biostudies-literature