Quantitatively Predicting Angle-Resolved Polarized Raman Intensity of Anisotropic Layered Materials.

ABSTRACT: Angle-resolved polarized Raman (ARPR) spectroscopy provides insights into optical anisotropy and symmetry-related electron-photon/electron-phonon couplings of anisotropic layered materials (ALMs). However, since their discovery over ten years ago, ARPR responses in ALM flakes has exhibited a puzzling dependence on flake thickness, excitation wavelength, and dielectric environment, complicating their understanding and prediction. By taking black phosphorus (BP) (⩾20 nm) flakes and four-layer Td-WTe₂ as examples, this study introduces intrinsic Raman tensors (R^int) and proposes strategies to predict the ARPR intensity profiles of thick and atomically-thin ALM flakes by considering birefringence, linear dichroism and multilayer interference inside multilayered structures

SUBMITTER: Xie JL 

PROVIDER: S-EPMC12510302 | biostudies-literature | 2025 Oct

REPOSITORIES: biostudies-literature