QTL Mapping for Leaf Rust Resistance in a Common Wheat Recombinant Inbred Line Population of Doumai/Shi4185.

ABSTRACT: Leaf rust, a devastating fungal disease caused by Puccinia triticina (Pt), severely impacts wheat quality and yield. Identifying genetic loci for wheat leaf rust resistance, developing molecular markers, and breeding resistant varieties is the most environmentally friendly and economical strategy for disease control. This study utilized a recombinant inbred line (RIL) population of Doumai and Shi4185, combined with the wheat 90 K single nucleotide polymorphisms (SNPs) chip data and maximum disease severity (MDS) of leaf rust from four environments, to identify adult plant resistance (APR) loci through linkage mapping. Additionally, kompetitive allele-specific PCR (KASP) markers suitable for breeding were developed, and genetic effects were validated in a natural population. In this

SUBMITTER: Wang Y 

PROVIDER: S-EPMC12526481 | biostudies-literature | 2025 Oct

REPOSITORIES: biostudies-literature