Tip treatment for subnanoscale atomic force microscopy in liquid by atomic layer deposition Al2O3 coating.

ABSTRACT: Atomic force microscopy (AFM) allows direct imaging of atomic- or molecular-scale surface structures in liquid. However, such subnanoscale measurements are often sensitive to the AFM tip properties. To overcome this problem, 30 nm Si-sputter coating was proposed, and its effectiveness in improving stability and reproducibility has been demonstrated in atomic-scale imaging of various materials. However, this method involves tip blunting, enhancing the tip-induced dilation effect. As an alternative method, here we investigate atomic layer deposition (ALD) Al2O3-coating, where the film thickness is atomically well-controlled. Our transmission electron microscopy, contact angle and force curve measurements consistently suggest that as-purchased tips are covered with organic contaminants, and t

SUBMITTER: Kojima R 

PROVIDER: S-EPMC12527287 | biostudies-literature | 2025 Oct

REPOSITORIES: biostudies-literature