Mechanical property measurements enabled by short-term Fourier-transform of atomic force microscopy thermal deflection analysis.

ABSTRACT: Contact resonance atomic force microscopy (CR-AFM) has been used in many studies to characterize variations in the elastic and viscoelastic constants of materials along a heterogeneous surface. In almost all experimental work, the quantitative modulus of the surface is calculated in reference to a known reference material, rather than calculated directly from the dynamics models of the cantilever. We measured the cantilever displacement with very high sampling frequencies over the course of the experiment and captured its oscillations that result from thermal energy. Using short-term Fourier transformations, it was possible to fit the thermal resonance peak of the normal displacement to track the frequency and Q-factor of the cantilever during an experiment, using a similar process to that

SUBMITTER: Mathias T 

PROVIDER: S-EPMC12599401 | biostudies-literature | 2025

REPOSITORIES: biostudies-literature