Direct Imaging of Nanoscale Ferroelectric Domains and Polarization Reversal in Ferroelectric Capacitors.

ABSTRACT: Ferroelectric thin films present a powerful platform for next-generation computing and memory applications. However, domain morphology and dynamics in buried ferroelectric stacks have remained underexplored, despite their importance for real device performance. Here, nanoprobe X-ray diffraction (nano-XRD) is used to image ferroelectric domains inside BiFeO₃-based capacitors, revealing local disorder in domain architecture and partial polarization reorientation caused by the capacitor electrostatic boundary conditions and internal stress. We demonstrate sensitivity to ferroelectric reversal in poled capacitors, highlighting expansive/compressive (001) strain for up-/down-polarization using nano-XRD. We observe significant quantitative and qualitative differences between poling by

SUBMITTER: Hill Landberg MO 

PROVIDER: S-EPMC12616765 | biostudies-literature | 2025 Nov

REPOSITORIES: biostudies-literature