Ultrafast Laser Shock Straining in Chiral Chain 2D Materials: Mold Topology-Controlled Anisotropic Deformation.

ABSTRACT: Tellurene, a chiral chain semiconductor with a narrow bandgap and exceptional strain sensitivity, emerges as a pivotal material for tailoring electronic and optoelectronic properties via strain engineering. This study elucidates the fundamental mechanisms of ultrafast laser shock imprinting (LSI) in two-dimensional tellurium (Te), establishing a direct relationship between strain field orientation, mold topology, and anisotropic structural evolution. This is the first demonstration of ultrafast LSI on chiral chain Te unveiling orientation-sensitive dislocation networks. By applying controlled strain fields parallel or transverse to Te's helical chains, we uncover two distinct deformation regimes. Strain aligned parallel to the chain's direction induces gliding and rotation governed by weak

SUBMITTER: Liu X 

PROVIDER: S-EPMC12627285 | biostudies-literature | 2025 Nov

REPOSITORIES: biostudies-literature