The Role of the Anion Insertion-Extraction Reaction in Amorphous Carbon Thin Film Electrodes on the Vanadium(IV/V) Reaction Probed by Scanning Electrochemical Cell Microscopy.

ABSTRACT: The influence of high potentials on amorphous nitrogen-free and nitrogen-doped hydrogenated carbon thin film electrodes with thicknesses of 9 to 30 nm is probed toward the vanadium(IV/V) redox reaction by scanning electrochemical cell microscopy (SECCM), which mimics the reaction of the positive side of the all-vanadium redox flow battery (VRFB). Besides the evaluation of the peak separation (E_PP) from cyclic voltammograms (CV), the localized probing is adapted in a way that the influence of high overpotentials on the stability of the carbon materials, as well as competitive electrochemical processes, can be analyzed. The sulfate anion insertion process is found to be the predominant process in all samples, with its onset appearing in parallel to the vanadium(IV/V) reaction. The

SUBMITTER: Hamann M 

PROVIDER: S-EPMC12632429 | biostudies-literature | 2025 Nov

REPOSITORIES: biostudies-literature