Direct Measurement of Density for Evaporated Thin Films.

ABSTRACT: A simple and elegant method is reported for direct measurement of the density of vapor-deposited thin films using a combination of profilometry, microscopy, and high-vacuum thermogravimetric analysis (TGA). Density affects fabrication control, optical properties, charge transport, and mechanical properties of thin film devices. Accurate density determination is essential for optimizing device design to ensure film stability, charge balance, and light-matter interactions. Exact mass of the vapor-deposited thin films with suitable mass and aspect ratio is determined by high-vacuum TGA. Combined with precise measurements of thickness and area for each film, the true density of individual films is captured as deposited. This method avoids common universalizing assumptions about the degree of c

SUBMITTER: Plint T 

PROVIDER: S-EPMC12641363 | biostudies-literature | 2025 Nov

REPOSITORIES: biostudies-literature