Impact of the Schottky Barrier and Contact-Induced Strain Variations inside the Channel on the Electrical Behavior of Monolayer MoS<sub>2</sub> Transistors.
Ontology highlight
ABSTRACT: Strain-dependent electronic and optical properties are one of the most appealing features of 2D semiconductors, like monolayer (1L) MoS2. However, measuring and controlling the homogeneity of strain within the channel is crucial for next-generation MoS2 field-effect transistors (FETs). This article reports a multiscale investigation of backgated FETs fabricated using large-area 1L MoS2 flakes grown by liquid-precursor-intermediated chemical vapor deposition on SiO2/Si substrates. The devices exhibit very attractive properties for ultra-low power applications, such as an I on/I off > 106 and a normally off electrical behavior. The combination of temperature-dependent analyses of the FET transfer chara
SUBMITTER: Panasci SE
PROVIDER: S-EPMC12697886 | biostudies-literature | 2025 Dec
REPOSITORIES: biostudies-literature
ACCESS DATA