Dual-Functional 3D-Nanoprinted AFM Probes for Correlative Magnetic and Conductive Characterization.

ABSTRACT: Based on previously reported 3D nanoprinted probes for magnetic force microscopy (MFM), a new class of dual-functional atomic force microscopy (AFM) probes - termed MC-Probes - is presented that integrates magnetic (M) and conductive (C) functionality in a single, monolithic structure. 3D nanoprinting via Focused Electron Beam Induced Deposition allows direct exploitation of the intrinsic magnetic and conductive properties of the employed Co₃Fe precursor. The coating-free probes feature sub-10 nm apex radii combined with a mechanically robust pillar geometry, designed to support both contact and tapping-mode operation depending on the cantilever choice. Comprehensive characterization reveals electrical resistivity ≈ 2 × 10³ · µΩ · cm and full tip resistances of, ∼ 1 -

SUBMITTER: Seewald LM 

PROVIDER: S-EPMC12790381 | biostudies-literature | 2026 Jan

REPOSITORIES: biostudies-literature