XPS Peak-Fitting of 2H MoS₂, 1T MoS₂, and MoS_2‑X Nanosheets in MoS₂ Powders and Battery Electrodes After Ar⁺ Ion Depth-Profiling.

ABSTRACT: The two common characterization techniques that can distinguish between the metastable 1T and stable 2H phase of molybdenum disulfide (MoS₂) are Raman spectroscopy and X-ray photoelectron spectroscopy (XPS). Argon ion etching within XPS offers the possibility to explore sample composition as a function of depth. However, for 2H MoS₂ samples this results in sample alteration via the creation of sulfur vacancies and leads to local areas of MoS_2‑x and 1T/2H MoS₂. XPS MoS_2‑x generation (228.1 eV) and laboratory nanoscale 1T MoS₂ synthesis (228.4 eV) are easily mistaken in XPS, as both signals exhibit downshifted Mo 3d binding energies relative to 2H MoS₂ (229.3 eV). Thus, we applied a four split orbit pe

SUBMITTER: Marinov AD 

PROVIDER: S-EPMC12813980 | biostudies-literature | 2026 Jan

REPOSITORIES: biostudies-literature