Needle in a Haystack: Information Recovery in Low Signal-to-Noise Piezoresponse Force Microscopy Data.

ABSTRACT: Piezoresponse force microscopy (PFM) is a scanning probe microscopy (SPM)-based technique used to evaluate the nanoscale surface displacement developed in response to an applied electric voltage. PFM is routinely used to investigate the nanoscale functional response of ferroelectric materials: the piezoelectric response is dependent on the dielectric polarization and modification of the polarization state can result in measurable changes in the PFM signal. However, low signal-to-noise ratio (SNR) data is unavoidable, as both the response at domain walls, or at switching of the polarization, i.e., when polarization is extremely small or null, would result in limited or null piezoelectric strain. Given the importance of these features in understanding ferroelectric materials and their behavi

SUBMITTER: Williams KN 

PROVIDER: S-EPMC12825390 | biostudies-literature | 2026 Jan

REPOSITORIES: biostudies-literature