Genetic basis of flag leaf thickness and its contribution to yield in wheat (Triticum aestivum L.).

ABSTRACT:

Background

Previous studies on leaf morphological traits are predominantly focused on flag leaf length (FLL), width (FLW), and area (FLA), which are known to affect light interception. However, limited research has addressed on flag leaf thickness (FLT) and its intricate relationship with various yield components. Recent studies have highlighted the importance of FLT in determining photosynthetic capacity and yield potential in wheat. Understanding the genetic regulation of FLT and its interactions with other morphological traits is essential for developing wheat varieties with higher yield potential. Due to the technical difficulties of directly measuring FLT, earlier studies have typically relied on indirect methods.

Results

In contrast, this study directly measured FLT ac

SUBMITTER: Niu Y 

PROVIDER: S-EPMC12859943 | biostudies-literature | 2025 Dec

REPOSITORIES: biostudies-literature