Force scanning: a rapid, high-resolution approach for spatial mechanical property mapping.

ABSTRACT: Atomic force microscopy (AFM) can be used to co-localize mechanical properties and topographical features through property mapping techniques. The most common approach for testing biological materials at the microscale and nanoscale is force mapping, which involves taking individual force curves at discrete sites across a region of interest. The limitations of force mapping include long testing times and low resolution. While newer AFM methodologies, like modulated scanning and torsional oscillation, circumvent this problem, their adoption for biological materials has been limited. This could be due to their need for specialized software algorithms and/or hardware. The objective of this study is to develop a novel force scanning technique using AFM to rapidly capture high-resolution topogr

SUBMITTER: Darling EM 

PROVIDER: S-EPMC3150532 | biostudies-literature | 2011 Apr

REPOSITORIES: biostudies-literature