Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.

ABSTRACT:

Background

Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution images on a wide range of surfaces, and has demonstrated the capability for atomic manipulation solely using chemical forces. Nonetheless, the role of the tip apex in both imaging and manipulation remains poorly understood and is an active area of research both experimentally and theoretically. Recent work employing specially functionalised tips has provided additional impetus to elucidating the role of the tip apex in the observed contrast.

Results

We present an analysis of the influence of the tip apex during imaging of the Si(100) substrate in ultra-high vacuum (UHV) at 5 K using a qPlus sensor for noncontact atomic force microscopy (NC-AFM). Data demonstrating stable imaging w

SUBMITTER: Sweetman A 

PROVIDER: S-EPMC3304327 | biostudies-literature | 2012

REPOSITORIES: biostudies-literature