Effect of mechanical loads on stability of nanodomains in ferroelectric ultrathin films: towards flexible erasing of the non-volatile memories.

ABSTRACT: Intensive investigations have been drawn on nanoscale ferroelectrics for their prospective applications such as developing memory devices. In contrast with the commonly used electrical means to process (i.e., read, write or erase) the information carried by ferroelectric domains, at present, mechanisms of non-electrical processing ferroelectric domains are relatively lacking. Here we make a systematical investigation on the stability of 180° cylindrical domains in ferroelectric nanofilms subjected to macroscopic mechanical loads, and explore the possibility of mechanical erasing. Effects of domain size, film thickness, temperature and different mechanical loads, including uniform strain, cylindrical bending and wavy bending, have been revealed. It is found that the stability of a cylindric

SUBMITTER: Chen WJ 

PROVIDER: S-EPMC4061556 | biostudies-literature | 2014 Jun

REPOSITORIES: biostudies-literature