Spatially-resolved mapping of history-dependent coupled electrochemical and electronical behaviors of electroresistive NiO.

ABSTRACT: Bias-induced oxygen ion dynamics underpins a broad spectrum of electroresistive and memristive phenomena in oxide materials. Although widely studied by device-level and local voltage-current spectroscopies, the relationship between electroresistive phenomena, local electrochemical behaviors, and microstructures remains elusive. Here, the interplay between history-dependent electronic transport and electrochemical phenomena in a NiO single crystalline thin film with a number of well-defined defect types is explored on the nanometer scale using an atomic force microscopy-based technique. A variety of electrochemically-active regions were observed and spatially resolved relationship between the electronic and electrochemical phenomena was revealed. The regions with pronounced electroresistive

SUBMITTER: Sugiyama I 

PROVIDER: S-EPMC4205888 | biostudies-literature | 2014 Oct

REPOSITORIES: biostudies-literature