Origin of anomalous piezoresistive effects in VLS grown Si nanowires.

ABSTRACT: Although the various effects of strain on silicon are subject of intensive research since the 1950s the physical background of anomalous piezoresistive effects in Si nanowires (NWs) is still under debate. Recent investigations concur in that due to the high surface-to-volume ratio extrinsic surface related effects superimpose the intrinsic piezoresistive properties of nanostructures. To clarify this interplay of piezoresistive effects and stress related surface potential modifications, we explored a particular tensile straining device (TSD) with a monolithic embedded vapor-liquid-solid (VLS) grown Si NW. Integrating the suspended NW in a gate all around (GAA) field effect transistor (FET) configuration with a transparent gate stack enables optical and field modulated electrical characteriz

SUBMITTER: Winkler K 

PROVIDER: S-EPMC4358075 | biostudies-literature | 2015 Mar

REPOSITORIES: biostudies-literature