Quantitative electron phase imaging with high sensitivity and an unlimited field of view.

ABSTRACT: As it passes through a sample, an electron beam scatters, producing an exit wavefront rich in information. A range of material properties, from electric and magnetic field strengths to specimen thickness, strain maps and mean inner potentials, can be extrapolated from its phase and mapped at the nanoscale. Unfortunately, the phase signal is not straightforward to obtain. It is most commonly measured using off-axis electron holography, but this is experimentally challenging, places constraints on the sample and has a limited field of view. Here we report an alternative method that avoids these limitations and is easily implemented on an unmodified transmission electron microscope (TEM) operating in the familiar selected area diffraction mode. We use ptychography, an imaging technique popula

SUBMITTER: Maiden AM 

PROVIDER: S-EPMC4589788 | biostudies-literature | 2015 Oct

REPOSITORIES: biostudies-literature