Spectromicroscopic insights for rational design of redox-based memristive devices.

ABSTRACT: The demand for highly scalable, low-power devices for data storage and logic operations is strongly stimulating research into resistive switching as a novel concept for future non-volatile memory devices. To meet technological requirements, it is imperative to have a set of material design rules based on fundamental material physics, but deriving such rules is proving challenging. Here, we elucidate both switching mechanism and failure mechanism in the valence-change model material SrTiO3, and on this basis we derive a design rule for failure-resistant devices. Spectromicroscopy reveals that the resistance change during device operation and failure is indeed caused by nanoscale oxygen migration resulting in localized valence changes between Ti(4+) and Ti(3+). While fast reoxidation typical

SUBMITTER: Baeumer C 

PROVIDER: S-EPMC4634325 | biostudies-literature | 2015 Oct

REPOSITORIES: biostudies-literature