Free Form Deformation-Based Image Registration Improves Accuracy of Traction Force Microscopy.

ABSTRACT: Traction Force Microscopy (TFM) is a widespread method used to recover cellular tractions from the deformation that they cause in their surrounding substrate. Particle Image Velocimetry (PIV) is commonly used to quantify the substrate's deformations, due to its simplicity and efficiency. However, PIV relies on a block-matching scheme that easily underestimates the deformations. This is especially relevant in the case of large, locally non-uniform deformations as those usually found in the vicinity of a cell's adhesions to the substrate. To overcome these limitations, we formulate the calculation of the deformation of the substrate in TFM as a non-rigid image registration process that warps the image of the unstressed material to match the image of the stressed one. In particular, we propos

SUBMITTER: Jorge-Penas A 

PROVIDER: S-EPMC4671587 | biostudies-literature | 2015

REPOSITORIES: biostudies-literature