In situ X-ray diffraction and the evolution of polarization during the growth of ferroelectric superlattices.

ABSTRACT: In epitaxially strained ferroelectric thin films and superlattices, the ferroelectric transition temperature can lie above the growth temperature. Ferroelectric polarization and domains should then evolve during the growth of a sample, and electrostatic boundary conditions may play an important role. In this work, ferroelectric domains, surface termination, average lattice parameter and bilayer thickness are simultaneously monitored using in situ synchrotron X-ray diffraction during the growth of BaTiO3/SrTiO3 superlattices on SrTiO3 substrates by off-axis radio frequency magnetron sputtering. The technique used allows for scan times substantially faster than the growth of a single layer of material. Effects of electric boundary conditions are investigated by growing the same superlattice

SUBMITTER: Bein B 

PROVIDER: S-EPMC4686826 | biostudies-literature | 2015 Dec

REPOSITORIES: biostudies-literature