Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope.

ABSTRACT: Beam damage caused by energetic electrons in the transmission electron microscope is a fundamental constraint limiting the collection of artifact-free information. Through understanding the influence of the electron beam, experimental routines may be adjusted to improve the data collection process. Investigations of CeO₂ indicate that there is not a critical dose required for the accumulation of electron beam damage. Instead, measurements using annular dark field scanning transmission electron microscopy and electron energy loss spectroscopy demonstrate that the onset of measurable damage occurs when a critical dose rate is exceeded. The mechanism behind this phenomenon is that oxygen vacancies created by exposure to a 300keV electron beam are actively annihilated as the sample

SUBMITTER: Johnston-Peck AC 

PROVIDER: S-EPMC5091080 | biostudies-literature | 2016 Nov

REPOSITORIES: biostudies-literature