Atomic Resolution Interfacial Structure of Lead-free Ferroelectric K_0.5Na_0.5NbO₃ Thin films Deposited on SrTiO₃.

ABSTRACT: Oxide interface engineering has attracted considerable attention since the discovery of its exotic properties induced by lattice strain, dislocation and composition change at the interface. In this paper, the atomic resolution structure and composition of the interface between the lead-free piezoelectric (K_0.5Na_0.5)NbO₃ (KNN) thin films and single-crystalline SrTiO₃ substrate were investigated by means of scanning transmission electron microscopy (STEM) combining with electron energy loss spectroscopy (EELS). A sharp epitaxial interface was observed to be a monolayer composed of Nb and Ti cations with a ratio of 3/1. The First-Principles Calculations indicated the interface monolayer showed different electronic structure and played the vital role

SUBMITTER: Li C 

PROVIDER: S-EPMC5122904 | biostudies-literature | 2016 Nov

REPOSITORIES: biostudies-literature