Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy.

ABSTRACT: The development of new materials and devices for flexible electronics depends crucially on the understanding of how strain affects electronic material properties at the nano-scale. Scanning Kelvin-Probe Microscopy (SKPM) is a unique technique for nanoelectronic investigations as it combines non-invasive measurement of surface topography and surface electrical potential. Here we show that SKPM in non-contact mode is feasible on deformed flexible samples and allows to identify strain induced electronic defects. As an example we apply the technique to investigate the strain response of organic thin film transistors containing TIPS-pentacene patterned on polymer foils. Controlled surface strain is induced in the semiconducting layer by bending the transistor substrate. The amount of local stra

SUBMITTER: Cramer T 

PROVIDER: S-EPMC5133578 | biostudies-literature | 2016 Dec

REPOSITORIES: biostudies-literature