Rapid mapping of polarization switching through complete information acquisition.
Ontology highlight
ABSTRACT: Polarization switching in ferroelectric and multiferroic materials underpins a broad range of current and emergent applications, ranging from random access memories to field-effect transistors, and tunnelling devices. Switching in these materials is exquisitely sensitive to local defects and microstructure on the nanometre scale, necessitating spatially resolved high-resolution studies of these phenomena. Classical piezoresponse force microscopy and spectroscopy, although providing necessary spatial resolution, are fundamentally limited in data acquisition rates and energy resolution. This limitation stems from their two-tiered measurement protocol that combines slow (∼1 s) switching and fast (∼10 kHz-1 MHz) detection waveforms. Here we develop an approach for rapid probing of ferroelectri
SUBMITTER: Somnath S
PROVIDER: S-EPMC5146286 | biostudies-literature | 2016 Dec
REPOSITORIES: biostudies-literature
ACCESS DATA