Noise in NC-AFM measurements with significant tip-sample interaction.

ABSTRACT: The frequency shift noise in non-contact atomic force microscopy (NC-AFM) imaging and spectroscopy consists of thermal noise and detection system noise with an additional contribution from amplitude noise if there are significant tip-sample interactions. The total noise power spectral density D^Δf (f_m) is, however, not just the sum of these noise contributions. Instead its magnitude and spectral characteristics are determined by the strongly non-linear tip-sample interaction, by the coupling between the amplitude and tip-sample distance control loops of the NC-AFM system as well as by the characteristics of the phase locked loop (PLL) detector used for frequency demodulation. Here, we measure D^Δf (f

SUBMITTER: Lubbe J 

PROVIDER: S-EPMC5238627 | biostudies-literature | 2016

REPOSITORIES: biostudies-literature