Ontology highlight
ABSTRACT:
SUBMITTER: Xu CS
PROVIDER: S-EPMC5476429 | biostudies-literature | 2017 May
REPOSITORIES: biostudies-literature
eLife 20170513
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) can automatically generate 3D images with superior z-axis resolution, yielding data that needs minimal image registration and related post-processing. Obstacles blocking wider adoption of FIB-SEM include slow imaging speed and lack of long-term system stability, which caps the maximum possible acquisition volume. Here, we present techniques that accelerate image acquisition while greatly improving FIB-SEM reliability, allowing the system to ...[more]