Materials analysis and focused ion beam nanofabrication of topological insulator Bi₂Se₃.

ABSTRACT: Focused ion beam milling allows manipulation of the shape and size of nanostructures to create geometries potentially useful for opto-electronics, thermoelectrics, and quantum computing. We focus on using the ion beam to control the thickness of Bi₂Se₃ and to create nanowires from larger structures. Changes in the material structure of Bi₂Se₃ nanomaterials that have been milled using a focused ion beam are presented. In order to characterize the effects of ion beam processing on the samples, we use a variety of techniques including analytical transmission electron microscopy and atomic force microscopy. The results show that while part of the material remains intact after shaping, amorphous regions form where the beam has been used to thin the sa

SUBMITTER: Friedensen S 

PROVIDER: S-EPMC5647386 | biostudies-literature | 2017 Oct

REPOSITORIES: biostudies-literature