Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomography.

ABSTRACT:

Background

Wheat is one of the most widely grown crop in temperate climates for food and animal feed. In order to meet the demands of the predicted population increase in an ever-changing climate, wheat production needs to dramatically increase. Spike and grain traits are critical determinants of final yield and grain uniformity a commercially desired trait, but their analysis is laborious and often requires destructive harvest. One of the current challenges is to develop an accurate, non-destructive method for spike and grain trait analysis capable of handling large populations.

Results

In this study we describe the development of a robust method for the accurate extraction and measurement of spike and grain morphometric parameters from images acquired by X-ray micro-comput

SUBMITTER: Hughes A 

PROVIDER: S-EPMC5664813 | biostudies-literature | 2017

REPOSITORIES: biostudies-literature