Semiconductor SERS enhancement enabled by oxygen incorporation.

ABSTRACT: Semiconductor-based surface-enhanced Raman spectroscopy (SERS) substrates represent a new frontier in the field of SERS. However, the application of semiconductor materials as SERS substrates is still seriously impeded by their low SERS enhancement and inferior detection sensitivity, especially for non-metal-oxide semiconductor materials. Herein, we demonstrate a general oxygen incorporation-assisted strategy to magnify the semiconductor substrate-analyte molecule interaction, leading to significant increase in SERS enhancement for non-metal-oxide semiconductor materials. Oxygen incorporation in MoS₂ even with trace concentrations can not only increase enhancement factors by up to 100,000-fold compared with oxygen-unincorporated samples but also endow MoS₂ with low li

SUBMITTER: Zheng Z 

PROVIDER: S-EPMC5722866 | biostudies-literature | 2017 Dec

REPOSITORIES: biostudies-literature