X-ray diffraction tomography with limited projection information.
Ontology highlight
ABSTRACT: X-ray diffraction tomography (XDT) records the spatially-resolved X-ray diffraction profile of an extended object. Compared to conventional transmission-based tomography, XDT displays high intrinsic contrast among materials of similar electron density and improves the accuracy in material identification thanks to the molecular structural information carried by diffracted photons. However, due to the weak diffraction signal, a tomographic scan covering the entire object typically requires a synchrotron facility to make the acquisition time more manageable. Imaging applications in medical and industrial settings usually do not require the examination of the entire object. Therefore, a diffraction tomography modality covering only the region of interest (ROI) and subsequent image reconstructi
SUBMITTER: Zhu Z
PROVIDER: S-EPMC5764978 | biostudies-literature | 2018 Jan
REPOSITORIES: biostudies-literature
ACCESS DATA