Genetic and Developmental Basis for Increased Leaf Thickness in the Arabidopsis Cvi Ecotype.

ABSTRACT: Leaf thickness is a quantitative trait that is associated with the ability of plants to occupy dry, high irradiance environments. Despite its importance, leaf thickness has been difficult to measure reproducibly, which has impeded progress in understanding its genetic basis, and the associated anatomical mechanisms that pattern it. Here, we used a custom-built dual confocal profilometer device to measure leaf thickness in the Arabidopsis Ler × Cvi recombinant inbred line population and found statistical support for four quantitative trait loci (QTL) associated with this trait. We used publically available data for a suite of traits relating to flowering time and growth responses to light quality and show that three of the four leaf thickness QTL coincide with QTL for at least one of these

SUBMITTER: Coneva V 

PROVIDER: S-EPMC5861201 | biostudies-literature | 2018

REPOSITORIES: biostudies-literature