Electrically-triggered micro-explosion in a graphene/SiO₂/Si structure.

ABSTRACT: Electrically-triggered micro-explosions in a metal-insulator-semiconductor (MIS) structure can fragment/atomize analytes placed on it, offering an interesting application potential for chip-scale implementation of atomic emission spectroscopy (AES). We have investigated the mechanisms of micro-explosions occurring in a graphene/SiO₂/Si (GOS) structure under a high-field pulsed voltage drive. Micro-explosions are found to occur more readily in inversion bias than in accumulation bias. Explosion damages in inversion-biased GOS differ significantly between n-Si and p-Si substrate cases: a highly localized, circular, protruding cone-shape melt of Si for the n-Si GOS case, whereas shallow, irregular, laterally-propagating trenches in SiO₂/Si for the p-Si GOS case. These di

SUBMITTER: Liu S 

PROVIDER: S-EPMC5943326 | biostudies-literature | 2018 May

REPOSITORIES: biostudies-literature