Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics.

ABSTRACT: The nanoscale optoelectronic properties of materials can be especially important for polycrystalline photovoltaics including many sensor and solar cell designs. For thin film solar cells such as CdTe, the open-circuit voltage and short-circuit current are especially critical performance indicators, often varying between and even within individual grains. A new method for directly mapping the open-circuit voltage leverages photo-conducting AFM, along with an additional proportional-integral-derivative feedback loop configured to maintain open-circuit conditions while scanning. Alternating with short-circuit current mapping efficiently provides complementary insight into the highly microstructurally sensitive local and ensemble photovoltaic performance. Furthermore, direct open-circuit volta

SUBMITTER: Atamanuk K 

PROVIDER: S-EPMC6009312 | biostudies-literature | 2018

REPOSITORIES: biostudies-literature