Structural determination of bilayer graphene on SiC(0001) using synchrotron radiation photoelectron diffraction.

ABSTRACT: In recent years there has been growing interest in the electronic properties of 'few layer' graphene films. Twisted layers, different stacking and register with the substrate result in remarkable unconventional couplings. These distinctive electronic behaviours have been attributed to structural differences, even if only a few structural determinations are available. Here we report the results of a structural study of bilayer graphene on the Si-terminated SiC(0001) surface, investigated using synchrotron radiation-based photoelectron diffraction and complemented by angle-resolved photoemission mapping of the electronic valence bands. Photoelectron diffraction angular distributions of the graphene C 1s component have been measured at different kinetic energies and compared with the results

SUBMITTER: Razado-Colambo I 

PROVIDER: S-EPMC6033894 | biostudies-literature | 2018 Jul

REPOSITORIES: biostudies-literature