Ferroelectric domain wall dynamics characterized with X-ray photon correlation spectroscopy.

ABSTRACT: Technologically important properties of ferroic materials are determined by their intricate response to external stimuli. This response is driven by distortions of the crystal structure and/or by domain wall motion. Experimental separation of these two mechanisms is a challenging problem which has not been solved so far. Here, we apply X-ray photon correlation spectroscopy (XPCS) to extract the contribution of domain wall dynamics to the overall response. Furthermore, we show how to distinguish the dynamics related to the passing of domain walls through the periodic (Peierls) potential of the crystal lattice and through the random potential caused by lattice defects (pinning centers). The approach involves the statistical analysis of correlations between X-ray speckle patterns produced by

SUBMITTER: Gorfman S 

PROVIDER: S-EPMC6055152 | biostudies-literature | 2018 Jul

REPOSITORIES: biostudies-literature