High-Density Mapping of an Adult-Plant Stripe Rust Resistance Gene YrBai in Wheat Landrace Baidatou Using the Whole Genome DArTseq and SNP Analysis.

ABSTRACT: Stripe rust, caused by the biotrophic fungus Puccinia striiformis f. sp. tritici (Pst), is one of the most widespread and destructive wheat diseases worldwide. Growing resistant cultivars is an effective approach for controlling this disease. However, because host resistance genes were easily overcome by new virulent Pst races, there is a continuous demand for identifying new effective wheat stripe rust resistance genes and develop closely linked markers for marker-assisted selection (MAS). Baidatou, an old Chinese wheat landrace, has been grown for several decades in Longnan region, Gansu Province, where stripe rust epidemics are frequent and severe. In our previous study, a single dominant gene YrBai in Baidatou was identified to control the adult-plant resistance (APR) to Chinese preval

SUBMITTER: Li Q 

PROVIDER: S-EPMC6083057 | biostudies-literature | 2018

REPOSITORIES: biostudies-literature