Subnanometer localization accuracy in widefield optical microscopy.

ABSTRACT: The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical microscopes lead to a widespread issue-overconfidence in measurement results with nanoscale statistical uncertainties that can be invalid due to microscale systematic errors. In this article, we report a comprehensive solution to this underappreciated problem. We develop arrays of subresolution apertures into the first reference materials that enable localization errors approaching the atomic scale across a submillimeter field. We present novel methods for calibrating our microscope system using aperture arrays and develop aberration corrections that reach the precision limit of our reference materials. We correct and register localization

SUBMITTER: Copeland CR 

PROVIDER: S-EPMC6107003 | biostudies-literature | 2018

REPOSITORIES: biostudies-literature