Serial electron crystallography for structure determination and phase analysis of nanocrystalline materials.

ABSTRACT: Serial electron crystallography has been developed as a fully automated method to collect diffraction data on polycrystalline materials using a transmission electron microscope. This enables useful data to be collected on materials that are sensitive to the electron beam and thus difficult to measure using the conventional methods that require long exposure of the same crystal. The data collection strategy combines goniometer translation with electron beam shift, which allows the entire sample stage to be probed. At each position of the goniometer, the locations of the crystals are identified using image recognition techniques. Diffraction data are then collected on each crystal using a quasi-parallel focused beam with a predefined size (usually 300-500 nm). It is shown that with a fast an

SUBMITTER: Smeets S 

PROVIDER: S-EPMC6157704 | biostudies-literature | 2018 Oct

REPOSITORIES: biostudies-literature