Three-beam convergent-beam electron diffraction for measuring crystallographic phases.

ABSTRACT: Under almost all circumstances, electron diffraction patterns contain information about the phases of structure factors, a consequence of the short wavelength of an electron and its strong Coulombic interaction with matter. However, extracting this information remains a challenge and no generic method exists. In this work, a set of simple analytical expressions is derived for the intensity distribution in convergent-beam electron diffraction (CBED) patterns recorded under three-beam conditions. It is shown that these expressions can be used to identify features in three-beam CBED patterns from which three-phase invariants can be extracted directly, without any iterative refinement processes. The octant, in which the three-phase invariant lies, can be determined simply by inspection of the

SUBMITTER: Guo Y 

PROVIDER: S-EPMC6211523 | biostudies-literature | 2018 Nov

REPOSITORIES: biostudies-literature