Isotropic Atomic Layer Etching of ZnO Using Acetylacetone and O₂ Plasma.

ABSTRACT: Atomic layer etching (ALE) provides Ångström-level control over material removal and holds potential for addressing the challenges in nanomanufacturing faced by conventional etching techniques. Recent research has led to the development of two main classes of ALE: ion-driven plasma processes yielding anisotropic (or directional) etch profiles and thermally driven processes for isotropic material removal. In this work, we extend the possibilities to obtain isotropic etching by introducing a plasma-based ALE process for ZnO which is radical-driven and utilizes acetylacetone (Hacac) and O₂ plasma as reactants. In situ spectroscopic ellipsometry measurements indicate self-limiting half-reactions with etch rates ranging from 0.5 to 1.3 Å/cycle at temperatures between 100 and 250 °C.

SUBMITTER: Mameli A 

PROVIDER: S-EPMC6225338 | biostudies-literature | 2018 Nov

REPOSITORIES: biostudies-literature