Probe-Sample Interaction-Independent Atomic Force Microscopy-Infrared Spectroscopy: Toward Robust Nanoscale Compositional Mapping.

ABSTRACT: Nanoscale topological imaging using atomic force microscopy (AFM) combined with infrared (IR) spectroscopy (AFM-IR) is a rapidly emerging modality to record correlated structural and chemical images. Although the expectation is that the spectral data faithfully represents the underlying chemical composition, the sample mechanical properties affect the recorded data (known as the probe-sample-interaction effect). Although experts in the field are aware of this effect, the contribution is not fully understood. Further, when the sample properties are not well-known or when AFM-IR experiments are conducted by nonexperts, there is a chance that these nonmolecular properties may affect analytical measurements in an uncertain manner. Techniques such as resonance-enhanced imaging and normalization

SUBMITTER: Kenkel S 

PROVIDER: S-EPMC6361725 | biostudies-literature | 2018 Aug

REPOSITORIES: biostudies-literature